1st Detect Corporation, a subsidiary of Astrotech Corporation, has been issued a key patent for improving the sensitivity and identification capability of the company’s unique ion trap, used for chemical analysis and detection.
U.S. Patent No. 8,784,737, entitled, ‘Introducing an Analyte into a Chemical Analyzer,’ represents a key technological advantage for 1st Detect to improve the sensitivity for portable small mass spectrometers without increasing our 30 second analysis time, a key advantage over the competitor’s GC-MS solutions.
“The technology protected by this patent demonstrates our ability to offer small, affordable mass spectrometers that produce high quality, stable output while identifying a wider range of chemicals, including threats and toxic chemicals, more quickly and with better sensitivity than competing solutions,” said David Rafferty, the inventor of the novel technology and President and CTO of 1st Detect.
The 1st Detect mass spectrometer utilizes core technology that is fast, highly sensitive and accurate. The unit is capable of detecting a wide variety of chemicals including residues and vapors from explosives, chemical warfare agents, toxic chemicals, food and beverage contaminants, and pollutants
1st Detect Corporation was formed by Astrotech Corporation to develop and commercialize miniature mass spectrometry technology first developed under an agreement with NASA for use on the International Space Station. The miniaturized mass spectrometer is rapid, lightweight, and cost-effective.
