National Test and Evaluation Conference

The National Defense Industrial Association (NDIA) will host the 32nd Annual National Test and Evaluation Conference on March 6-8, 2017 in San Diego, California.

The event seeks to focus on improving T&E in defense and homeland security acquisition systems under this year’s theme of ‘Strategic T&E Collaboration: Government-Industry Partnering to Achieve Decisive Operational Advantage’.

Senior T&E leaders and stakeholders will present their views on the current situation, what can be improved and how government & industry can partner to meet the near and long term needs.

Highlighted topics and presentations include:

• Comprehensive Use of Advanced Automation/Robotics in Explosives Detection T&E
• Explosives Simulant Verification and Validation
• Results of Improved Collaboration between Explosives Equipment Vendors and DT&E Engineers
• Development Test and Evaluation (DT&E) Bottle Liquid Scanner (BLS) Program
• Model-Based Approaches for the Safe Testing of Autonomous Aircraft
• Estimating Variability of Injuries in Underbody Blast Live-fire Testing for Evaluating Modeling and Simulation
• DARPA Robotics Challenge: Ten Years of Lesson Learned Put into Action
• Test Range Efficiency Panel
• Case Study in DoD/DHS Partnership
• The Integration of Mission Engineering and T&E
• The New Normal – Continuous Testing by T&E
• Formal Methods for Verification and Testing of Autonomous Systems
• Computational Prototyping Environments (CPEs) — A Strategy for the Cost Effective Acceleration of DOD Weapon Systems Development
• Lessons Learned in Planning and Executing F-35 Full Weapon System Testing
• Role of the Cyber T&E Range Executive Agent

Highlighted session moderators and panel participants include:

• Terry Murphy, Director, U.S. Department of Homeland Security DT&E
• Robert Klueg, Branch Chief, Spectroscopy Technologies Developmental T&E, DHS
• John Beck Jr., Deputy Director, Land Systems Operational Test and Evaluation Authority, U.S. Customs and Border Protection
• Michael Snyder, Branch Chief, X-ray Inspection Technologies Developmental T&E, DHS
• Michael Barrientos, Certification Readiness Test Lead, Bottled Liquid Scanner Systems, DHS S&T
• Mark Fry, Chief, Laboratory Operations, DHS/S&T/CDS/TSL
• Pete Christensen, Director, National Cyber Range, Test Resource Management Center
• Steve Hutchison, Director, Test & Evaluation, U.S. DHS
• Bill D’Amico, Johns Hopkins University Applied Physics Laboratory
• William Van Besien, Software Engineer, Embedded Applications Group, JHU APL
• Mark Bradbury, Chief Engineer, Cyber Operations, Development and Evaluation Center, Raytheon Company
• Danny Holtzman, SES (USAF), Technical Director, Cyber, U.S. Air Force
• Reed Young, Program Manager, Robotics and Autonomy, JHU APL

An optional off-site tour of SPAWAR Systems Center Pacific will be available to conference participants.

Please visit NDIA’s National Test and Evaluation Conference website for more information.